Diagnosis of Tunneling Opens
نویسندگان
چکیده
This paper resolves two issues regarding diagnosis of tunneling opens: efficient screening and accurate localization. In the first part, a test pattern selection and sorting algorithm is presented. It is shown that the presented algorithm saves IDDQ(t) test time without impacting on its effectiveness. The second part of this paper presents a locating algorithm which combines both VLV and IDDQ(t) test results. This technique is shown to be able to accurately locate the tunneling opens with higher resolution than a commercial single stuck-at fault diagnosis tool.
منابع مشابه
Appendix A . Testing for Tunneling Opens
A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or I DDQ testing. Theoretical calculations as well as Boolean and I DDQ experiments confirm the existence of tunneling opens. The Murphy experimental data show that seven out of nine VLV-only failure circuits can be explained by this failure mod...
متن کاملTesting for tunneling opens
A tunneling-open failure mode is proposed and carefully studied. A circuit with a tunneling open could pass at-speed Boolean tests but fail VLV testing or IDDQ testing. Theoretical calculations as well as Boolean and IDDQ experiments confirm the existence of tunneling opens. The Murphy experimental data show that seven out of nine VLV-only failure circuits can be explained by this failure mode....
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